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Capteur d'oxygène (EC) Orbisphere GA2400 en acier inoxydable, 40 bar, joints toriques en EPDM

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Réf. produit: GA2400-S00

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Brochures	Type	Langue	Taille	Date	Edition
Care Advantage : Solution de service complète pour tous vos instruments DOC030.77.10264		French	3 MB		Sep24
Care Advantage Brochure : Complete service solution for all your instruments DOC030.52.10264		English UK	5 MB		Sep24
Care Advantage Flyer: Complete service solution for all your instruments DOC060.52.10266		English UK	588 KB	2024-11	Oct24
Care Advantage: Une solution de service complète pour tous vos instruments DOC060.77.10266		French	357 KB	2024-11	Oct24
Introduction to Hach Services DOC060.52.10226		English UK	338 KB	2021-10	Jun21
Présentation des services Hach DOC060.77.10226		French	340 KB	2021-10	Jun21

Fiches techniques	Type	Langue	Taille	Date	Edition
Capteurs d’oxygène Orbisphere GA2400/GA2800 de Hach DOC053.77.35283		French	407 KB	2022-01	Jan22
Hach Orbisphere 3650/3655 - Mesure sélective de l’oxygène DOC053.77.35330		French	593 KB	2022-03	Jan22
Hach Orbisphere 3650/3655 Selective Oxygen Measurement DOC053.52.35330		English US, English UK	578 KB	2022-02	Jan22
Hach Orbisphere GA2400/GA2800 Oxygen Sensors DOC053.52.35283		English US, English UK	403 KB	2022-01	Jan22

Manuels	Type	Langue	Taille	Date	Edition
Basic User Manual : Orbisphere Model GA2X00 O2 EC Sensor DOC024.98.93153		Danish, Dutch, English UK, Finnish, French, German, Hungarian, Italian, Polish, Spanish, Czech, Swedish	2 MB	2024-08	Ed6
User Manual : Orbisphere Model GA2X00 O2 EC Sensor DOC344.52.93153		English UK, English US	4 MB	2024-07	Ed7

Notes d'application	Type	Langue	Taille	Date	Edition
Dissolved Oxygen and Hydrogen Analysis in Reactor Coolant Systems: Orbisphere 510 with Channel Compensation LIT2846		English US	82 KB	2015-09	Rev3
Dissolved Oxygen Measurement in Ultrapure Water for Semiconductor Manufacturing DOC043.53.30787		English US	146 KB	2024-06	Apr24
Dissolved Oxygen Measurement in Ultrapure water for Semiconductor Manufacturing DOC043.53.30784		English US	146 KB	2024-06	Apr24
Residual Oxygen controlled blanketing in the Semiconductor Industry DOC043.53.30785		English US	131 KB	2024-06	Apr24